Analysis of the Hardness for Cu/Ag Multilayers with Various Modulation Wavelengths
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Abstract:
Cu/Ag多層膜；Hall-Petch關(guān)系；位錯塞積模型；位錯穩(wěn)定性
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[Cao Ke, Ren Fengzhang, Su Juanhua, Zhao Shiyang, Tian Baohong. Analysis of the Hardness for Cu/Ag Multilayers with Various Modulation Wavelengths[J]. Rare Metal Materials and Engineering,2011,40(12):2152~2155.] DOI：[doi]