3)缺陷占主導(dǎo),主要為層間熔合不良,形成原因主要是能量輸入不足導(dǎo)致的熔池球化和熔化深度不足;當(dāng)線能量密度升高后(1.32J/mm和1.44J/mm和2.2J/mm),小尺寸(小于2000μm3)缺陷占主導(dǎo),其中的低球形度缺陷主要為微米級(jí)的樹枝狀孔洞,形成原因主要是熔池?cái)_動(dòng)引起的液體飛濺,高球形度的缺陷主要為微米級(jí)的近球形孔和納米級(jí)球形孔,形成原因主要是熔池凝固過程中的凝固收縮和枝晶間的顯微縮松。"/>

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粉床型電子束增材制造W-3.5Nb合金孔洞缺陷及其形成機(jī)制
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西北有色金屬研究院 金屬多孔材料國(guó)家重點(diǎn)實(shí)驗(yàn)室 西安 710016

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科學(xué)挑戰(zhàn)專題項(xiàng)目(項(xiàng)目號(hào)TZ2018006)


The formation process of pore defect in W-3.5Nb alloy fabricated by selective electron beam melting
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1.State Key Laboratory of porous Metal materials,Northwest Institute for Nonferrous Metal Research,Xi’an 710016;2.China

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    摘要:

    采用粉床型電子束增材制造技術(shù)制備了W-3.5Nb合金,研究了電子束線能量密度對(duì)W-3.5Nb合金孔洞缺陷形成的影響規(guī)律,分析了不同類型孔洞缺陷的形成原因。研究結(jié)果表明:隨著電子束線能量密度的升高,缺陷含量降低,當(dāng)線能量密度升高到1.44J/mm時(shí),缺陷的體積含量最低為0.01%,繼續(xù)增大線能量密度,缺陷的體積含量和數(shù)量有所增加。合金中孔洞缺陷可分為層間熔合不良、微米級(jí)樹枝狀孔、微米級(jí)近球形孔、納米級(jí)球形孔四類。在線能量密度較低(1.08J/mm)時(shí),大尺寸(大于5000μm3)缺陷占主導(dǎo),主要為層間熔合不良,形成原因主要是能量輸入不足導(dǎo)致的熔池球化和熔化深度不足;當(dāng)線能量密度升高后(1.32J/mm和1.44J/mm和2.2J/mm),小尺寸(小于2000μm3)缺陷占主導(dǎo),其中的低球形度缺陷主要為微米級(jí)的樹枝狀孔洞,形成原因主要是熔池?cái)_動(dòng)引起的液體飛濺,高球形度的缺陷主要為微米級(jí)的近球形孔和納米級(jí)球形孔,形成原因主要是熔池凝固過程中的凝固收縮和枝晶間的顯微縮松。

    Abstract:

    W-3.5Nb alloy was prepared by selective electron beam melting technology (SEBM). The influence of linear energy density on the formation of pore defects was studied. Different types of pore defects were analyzed. The results show that: With the increase of the linear energy density, the defect content decreased, the volume of defects was the lowest (0.01%) at the linear energy density of 1.44 J/mm. When the linear energy density continued to increase, the volume and quantity of defects increased. There were four types of pore defects in SEBM W-3.5Nb alloy: lack of fusion defects, micron dendritic pores, micron spherical pores and nano spherical pores. At the low linear energy density, the large defect (>5000 μm3) which was the lack of fusion caused by insufficient energy input and insufficient melting depth was dominant; when the energy density increased, the defect size was smaller (< 2000 μm3), among which the low sphericity defects were the dendrites defect caused by the dynamic flow of molten pool, and the high sphericity defects were micro and nano spherical pores caused by the shrinkage of the melting pool and micro shrinkage between dendrites during solidification.

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楊廣宇,湯慧萍,王建,賈文鵬,賈亮,劉楠.粉床型電子束增材制造W-3.5Nb合金孔洞缺陷及其形成機(jī)制[J].稀有金屬材料與工程,2022,51(2):573~578.[Yang Guangyu, Tang Huiping, Wang Jian, Jia Wenpeng, Jia Liang, Liu Nan. The formation process of pore defect in W-3.5Nb alloy fabricated by selective electron beam melting[J]. Rare Metal Materials and Engineering,2022,51(2):573~578.]
DOI:10.12442/j. issn.1002-185X.20210097

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  • 收稿日期:2021-02-01
  • 最后修改日期:2021-03-24
  • 錄用日期:2021-04-16
  • 在線發(fā)布日期: 2022-03-09
  • 出版日期: 2022-02-28