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V-4Cr-4Ti/Ti擴散連接接頭的界面結(jié)構(gòu)及力學性能研究
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北京科技大學,北京科技大學,瑞士保羅謝爾研究所,北京科技大學

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TG316.3

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Study on the Interface Microstructure and Bonding Strength of V-4Cr-4Ti/Ti Diffusion Bonding Joint
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University of Science and Technology Beijing,University of Science and Technology Beijing,,University of Science and Technology Beijing

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    摘要:

    利用鍛造加工進行了V-4Cr-4Ti/Ti兩種材料的擴散連接,并通過OM,SEM,EDS,剪切實驗等手段分析和研究了擴散接頭的界面結(jié)構(gòu)及其接合強度。微觀結(jié)構(gòu)分析表明,擴散接頭的總寬度約為100 μm,并分為明顯的Ⅰ、Ⅱ兩部分:Ti基體側(cè)的Ⅰ區(qū)較寬,由致密的針狀組織組成;V-4Cr-4Ti合金一側(cè)的Ⅱ區(qū)寬度約為Ⅰ區(qū)的一半,該區(qū)平滑無缺陷,未看到孔洞和裂紋等缺陷的存在。根據(jù)材料基體和擴散接頭處的硬度分布規(guī)律,可以將它們進一步分為A-F六個區(qū)域,其中C區(qū)的硬度最高,其與鈦基體交界區(qū)域的最大硬度高達332 HV,遠高于基體材料的硬度(鈦基體的平均硬度為190 HV,釩合金基體為258 HV),而E區(qū)的硬度較低,最低僅為182 HV。剪切實驗結(jié)果表明,擴散接頭的剪切強度大于165.2 MPa,且斷裂發(fā)生在靠近擴散接頭的鈦基邊界區(qū)域,這很可能是因為金屬鈦在冷卻過程中發(fā)生相變導致局部應(yīng)力集中所造成的。

    Abstract:

    The diffusion bonding of V-4Cr-4Ti alloy and pure titanium was achieved by the hot forging process. The interface microstructure and bonding strength of the diffusion joint were analyzed by OM, SEM, EDS, and shear test, respectively. The diffusion joint is about 100 μm wide in total, and can be divided into two zones with different width and microstructure. The SEM analysis across the diffusion interface presents a smooth diffusion interface without any defects. According to the Vickers hardness distribution across the substrates and the diffusion joint, it can be divided into six regions (A, B, C, D, E and F). The boundary zone of region C close to Ti substrate possesses the highest hardness of 332 HV, and the zone of region E close to region D has the lowest hardness(182 HV), while the average hardness of Ti substrate and V-4Cr-4Ti alloy are 190 HV and 258 HV, respectively. The result of shear test shows that the actual shear strength is higher than 165.2 MPa, and the fracture occurred at the boundary zone of titanium substrate close to the diffusion joint, which is mainly ascribed to the stress concentration due to the phase trasition for Ti substrate during cooling process.

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張高偉,韓文妥,崔麗娟,萬發(fā)榮. V-4Cr-4Ti/Ti擴散連接接頭的界面結(jié)構(gòu)及力學性能研究[J].稀有金屬材料與工程,2018,47(5):1537~1542.[Zhang Gaowei, Han Wentuo, Cui Lijuan, Wan Farong. Study on the Interface Microstructure and Bonding Strength of V-4Cr-4Ti/Ti Diffusion Bonding Joint[J]. Rare Metal Materials and Engineering,2018,47(5):1537~1542.]
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  • 收稿日期:2017-02-20
  • 最后修改日期:2017-05-20
  • 錄用日期:2017-06-23
  • 在線發(fā)布日期: 2018-06-08
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