2,同時(shí)有Zr-OH、Zr-N、C-H、N-H鍵。碳酰胺與氫化鋯高溫下原位反應(yīng)層滲透的機(jī)理是基體中H擴(kuò)散時(shí)被C、O、N捕捉形成相應(yīng)的C-H、O-H、N-H鍵。"/>

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碳酰胺與氫化鋯高溫下原位反應(yīng)層的AES/XPS分析
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北京有色金屬研究總院,北京有色金屬研究總院,北京有色金屬研究總院,北京有色金屬研究總院,北京有色金屬研究總院

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TB34

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國家自然科學(xué)資助(項(xiàng)目號(hào)51404034)


Investigation of Coatings Formed by Reaction Urea and Zirconium Hydride at High Temperature by AES and XPS Technique
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    摘要:

    本文采用碳酰胺高溫分解產(chǎn)生含C、O、N源與氫化鋯原位反應(yīng)制備阻氫滲透層,借助俄歇電子能譜(AES)和X射線光電子能譜(XPS)等手段對(duì)阻氫滲透層元素成分及深度、鍵態(tài)進(jìn)行分析。俄歇電子能譜(AES)結(jié)果表明:氫化鋯表面原位反應(yīng)層由C、N、O、Zr元素組成,隨濺射時(shí)間增加,O、Zr元素含量增加,C、N元素含量降低。原位反應(yīng)層厚度約3.4μm,其中含N、C層深度約150nm左右。氫化鋯表面阻氫滲透層XPS分析表明,表面層存在ZrO2,同時(shí)有Zr-OH、Zr-N、C-H、N-H鍵。碳酰胺與氫化鋯高溫下原位反應(yīng)層滲透的機(jī)理是基體中H擴(kuò)散時(shí)被C、O、N捕捉形成相應(yīng)的C-H、O-H、N-H鍵。

    Abstract:

    Hydrogen anti-permeation coatings were formed by chemical reaction using urea and zirconium hydride at a high temperature range. The composition and depth of elements, bond state were analyzed by auger electron spectroscopy(AES) and X-ray photoelectron spectroscopy(XPS) technique. The results indicate that the thickness of coating, which is mainly composed of carbon, nitrogen, oxygen and zirconium, is 3.4μm, of which including nitrogen and carbon the thickness is about 150nm. It shows that the atomic concentration of carbon and nitrogen decreased continuously, while, oxygen and zirconium increased. XPS shows that coating was including ZrO2, and Zr-OH, Zr-N, C-H, N-H bonds. The mechanism of hydrogen resistance maybe that hydrogen was seized by carbon, nitrogen and oxygen to form C-H, O-H and N-H bonds while it diffuses from zirconium hydrides.

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閆國慶,陳洋,吳明,彭家慶,王力軍.碳酰胺與氫化鋯高溫下原位反應(yīng)層的AES/XPS分析[J].稀有金屬材料與工程,2016,45(12):3302~3305.[Yan Guoqing, Chen Yang, Wu Ming, Peng Jiaqing, Wang Lijun. Investigation of Coatings Formed by Reaction Urea and Zirconium Hydride at High Temperature by AES and XPS Technique[J]. Rare Metal Materials and Engineering,2016,45(12):3302~3305.]
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  • 收稿日期:2016-01-25
  • 最后修改日期:2016-05-17
  • 錄用日期:2016-06-12
  • 在線發(fā)布日期: 2017-02-06
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