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A Ti-6Al-4V wall was fabricated by WAAM on the basis of substrate alloy. Residual stress in the WAAM-substrate wall was measured by using contour method. There were considerable residual stresses in the WAAM-substrate wall. A finite element model was developed to simulate stress release in the cutting processing of the compact tension (C(T)) specimen from the wall. The calculated residual stress retained in the C(T) specimen was in good agreement with the measurement result obtained by contour method. Residual stress evolution and its effects on the crack propagation behavior at the WAAM/substrate interface were estimated by the developed finite element model. Following observations are revealed by experimental and numerical analysis. Residual stress distributions are quite different in the Type A and C specimen. For Type A specimen (notch located in the substrate), the compression residual stress area is closed to the notch, whereas for the Type C specimen (notch located in the WAAM alloy), the compression residual stress area is far away from the notch. Residual stresses has a little effect on the fatigue crack growth life of Type A specimen since most of them are released after the crack quickly entered and went through the compression area. However, residual stresses decrease a little with the crack growth at a long period for Type C specimen, which results a considerable stress intensity factor and shortens the fatigue crack growth life.