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電沉積寬晶粒尺寸分布納米鎳的拉伸變形組織與變形行為
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Tensile Deformation Microstructures and Deformation Behaviours in Electrodeposited Nanocrystalline Ni with Broad Grain Size Distribution
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Natural Science Foundation Project of Fujian Province(2008J0145)

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    摘要:

    選用直流電沉積制備平均晶粒尺寸為27.2 nm,寬晶粒尺寸分布(5~120 nm)的納米鎳(簡稱寬晶納米鎳),在室溫采用拉伸應(yīng)變速率()突變法測量其應(yīng)變速率敏感指數(shù)(m)。 發(fā)現(xiàn)m隨的減小而增加,特別在小于2×10-5 s-1時,m快速增加,m在=5×10-6 s-1時達到0.054,表明塑性變形過程中晶界擴散、晶界滑移很可能被激活。在室溫進行循環(huán)加載-卸載拉伸測試,結(jié)果表明寬晶納米鎳晶內(nèi)存儲位錯的能力十分有限,當拉伸應(yīng)力達到1052 MPa,應(yīng)變?yōu)?.8%時,晶內(nèi)位錯密度達到飽和。通過對拉伸斷口附近的TEM觀察,證實寬晶納米鎳在塑性變形過程中存在顯著的類似粗晶中的晶內(nèi)位錯滑移

    Abstract:

    The electrodeposited nanocrystalline (nc) Ni with an average grain size of 27.2 nm and with a broad grain size distribution (BGSD) ranging from 5 to 120 nm was prepared. The tensile strain rate () jump test was performed at room temperature to measure the strain rate sensitivity (m). The result shows that m increases with decreasing of . In particular, when is less than 2×10-5 s-1, m increases rapidly which reaches 0.054 at =5×10-6 s-1, indicating that the deformation mechanisms involved in grain boundary diffusion and sliding are possibly activated. The room temperature loading-unloading tensile test was carried out. The results show that the capability of storing dislocations in BGSD nc Ni is very limited and the dislocation density is saturated when the stress reaches 1052 MPa with a strain of 7.8%. From the observation of TEM microstructures in the vicinity of tensile fracture, it is confirmed that there is significant intragranular dislocation sliding similar to that in coarse-grained materials in the process of plastic deformation of BGSD nc Ni

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許偉長,戴品強.電沉積寬晶粒尺寸分布納米鎳的拉伸變形組織與變形行為[J].稀有金屬材料與工程,2010,39(6).[Xu Weichang, Dai Pinqiang. Tensile Deformation Microstructures and Deformation Behaviours in Electrodeposited Nanocrystalline Ni with Broad Grain Size Distribution[J]. Rare Metal Materials and Engineering,2010,39(6).]
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  • 收稿日期:2009-06-09
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