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X射線衍射法測量單晶高溫合金的取向
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國家自然科學(xué)基金(50771081，50395102)


A XRD Method to Measure Orientation of Single Crystal Superalloys
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    摘要:

    以鎳基單晶高溫合金AM3為研究對象，介紹一種X射線衍射法測量單晶體取向的原理。該方法采用X射線θ掃描與試樣自轉(zhuǎn)相結(jié)合，使晶面法線多次通過衍射面來獲得晶體晶面與試樣外表面的夾角關(guān)系。通過實例計算與實驗結(jié)果相比較驗證了該方法的可靠性，說明高溫合金單晶取向性及判定的方法。該方法操作簡單、結(jié)果精確，是確定單晶高溫合金取向的有效途徑

    Abstract:

    A method to determine preferred orientation of Ni-base single crystal superalloys AM3 is presented by use of X-ray diffractometer. By rotating a sample along its surface axis during θ-scanning process to ensure the normal axis of the crystal plane to across the diffraction plane multiply, the relationship between the crystal plan and the surface is obtained. The credibility is discussed by comparing the results of calculation and experiments. The identification of single crystal superalloys and dispersion degree of crystal orientation are elucidated. It is found that this method is simple and accurate for identifying single crystal superalloys

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趙新寶,劉 林,余竹煥,劉 剛,傅恒志. X射線衍射法測量單晶高溫合金的取向[J].稀有金屬材料與工程,2009,38(7):1280~1283.[Zhao Xinbao, Liu Lin, Yu Zhuhuan, Liu Gang, Fu Hengzhi. A XRD Method to Measure Orientation of Single Crystal Superalloys[J]. Rare Metal Materials and Engineering,2009,38(7):1280~1283.]
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  • 收稿日期:2008-06-23
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