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納米V2O5薄膜的制備與特性
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國家自然科學基金(50272027)


Preparation and Characteristics of V2O5 Thin Film
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    摘要:

    采用溶膠-凝膠法在Si和普通玻璃基底上制備V2O5納米薄膜。在空氣中對樣品進行不同溫度的退火處理。利用X射線衍射、掃描電子顯微鏡和分光光度計對制備的V2O5薄膜的結(jié)構(gòu)、形貌和光學特性進行研究。XRD和SEM研究結(jié)果表明:可以通過升高退火溫度來提高薄膜的結(jié)晶程度、顆粒尺寸及其均勻程度,并增強V2O5的擇優(yōu)取向性。透射譜和吸收譜的研究結(jié)果表明:隨著退火溫度的升高,V2O5薄膜的吸收邊緣發(fā)生紅移,光學帶隙逐漸變窄。

    Abstract:

    The V2O5 thin film was prepared on the substrates of Si glass and commercial glass by the sol-gel technique. The samples prepared were annealed in air atmosphere at different temperatures. The microstructure, the morphology and optical properties of V2O5 thin films were studied by XRD, SEM and spectrophotometer. The results of XRD and SEM indicate that the better crystalline states and orientation with V2O5 (001) and (200) after annealing can be obtained, and the grain homogeneity on nano-V2O5 film surface can be improved through proper increasing of annealing temperatures; The results of transmission and absorption spectra show that a red shift will occur at the absorption edges of V2O5 films, and optical band gaps are shortened gradually with the increase of annealing temperature.

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劉亞強,劉雪芹.納米V2O5薄膜的制備與特性[J].稀有金屬材料與工程,2009,38(4):691~695.[Liu Yaqiang, Liu Xueqin. Preparation and Characteristics of V2O5 Thin Film[J]. Rare Metal Materials and Engineering,2009,38(4):691~695.]
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  • 收稿日期:2008-03-28
  • 最后修改日期:2008-06-11
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