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UC表層的X射線光電子能譜研究
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O614.6

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中國工程物理研究院基金資助項目(20020543)


Characterization of Uranium Monocarbide Surfaces by XPS
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    摘要:

    采用X射線光電子能譜(XPS)分析研究了燒結(jié)UC(包括钚的碳化物)樣品的表面層結(jié)構(gòu).分析結(jié)果表明,經(jīng)大氣氧化的UC表層由表及里大致組成為:少量UO2 x→UO2與UC的混合物及少量自由碳→UC基體.UC的U4f7/2峰和Cls峰結(jié)合能分別為378.2 eV和282 eV.定量分析表明,UC清潔表面的C/U原子比約為1:1,這與UC的化學(xué)組成一致,但此時仍能探測到少量固溶氧存在.初步探討了UC在大氣環(huán)境中的氧化機理.

    Abstract:

    The air-exposed surfaces of sintered UC samples at room temperature were examined by X-ray photoelectron spectroscopy (XPS). Elemental depth profiles reveal that the surface of UC consists of a top layer of small amounts of UO2+ ; this very thin layer is x followed by a layer containing uranium dioxide, uranium monocarbide and free carbon and then bulk UC. The binding energy of U4f7/2 and C1s peaks of UC is found to be 378.2 eV and 282 eV, respectively. Quantitative analysis indicates that the C/U atomic ratio of clean UC surfaces is approximately 1?1, which is consistent with stoichiometric UC, but there exists small amounts of dissolved oxygen on sputter-cleaned UC surfaces. The oxidation mechanism of UC has been also discussed.

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伏曉國 鐘永強 汪小琳 劉柯釗 賴新春 趙正平. UC表層的X射線光電子能譜研究[J].稀有金屬材料與工程,2005,34(3):359~362.[Fu Xiaoguo, Zhong Yongqiang, Wang Xiaolin, Liu Kezhao, Lai Xinchun, Zhao Zhengping. Characterization of Uranium Monocarbide Surfaces by XPS[J]. Rare Metal Materials and Engineering,2005,34(3):359~362.]
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  • 最后修改日期:2003-09-09
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