The principle and method of plotting new kUP (tube voltage)T(thickness of specimen)F(focal distance) exposure curves for the use of radiographic examination of Ti with focal distances of 0412 m are described. The test results show that the method of plotting the kUpTF curve is not only simple, economical and practical, but also good for the image quality of the photographic plate and the photographic efficiency. The curve is also ideal for choosing an accurate value of tube voltage for the onsite radiographic examination of Ti pressure vessels.
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魏惠元.適用鈦不同焦距X射線照相用的KUp—T—F曝光曲線[J].稀有金屬材料與工程,1999,(3):189~191.[Wei Huiyuan. A KUP-T-F Exposure Curve for the Use of Radiographic Examination of Ti with Various Focal Distances[J]. Rare Metal Materials and Engineering,1999,(3):189~191.] DOI:[doi]