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工藝條件對(duì)C軸擇優(yōu)取向YBCO厚膜點(diǎn)陣常數(shù)的影響
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Influence of Process Conditions on Lattice Parameter of High Textured YBa2Cu3O7 Thick Films
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    摘要:

    用Ｘ射線衍射線對(duì)法測(cè)量了具有強(qiáng)Ｃ軸擇優(yōu)取向的ＹＢＣＯ厚膜的點(diǎn)陣常數(shù)Ｃ。用Ｎｉ基帶制備的樣品的點(diǎn)陣常數(shù)值小于過(guò)去報(bào)導(dǎo)過(guò)的燒結(jié)樣品的點(diǎn)陣常數(shù)Ｃ值，也小于用Ａｇ—Ｐｄ基帶制備的樣品的點(diǎn)陣常數(shù)ｃ值。噴霧時(shí)基帶加熱溫度的升高，噴霧后燒結(jié)溫度的提高，和區(qū)熔時(shí)樣品移動(dòng)速度的加快，都使樣品點(diǎn)陣常數(shù)ｃ降低。一般來(lái)說(shuō)，具有較高Ｔｃ值的樣品具有較低的點(diǎn)陣常數(shù)ｃ值．

    Abstract:

    he lattice parameter c values of highly textured YBCO thick films were calculated by using an X-ray diffraction dual-line method. The lattice parameter values of samples prepared on Ni substrate rather smaller than those of sintered samples and thick films prepared on Ag-Pd substrate. Increasing substrate temperature during spray, sintering temperature after spray, and moving speed of smsples during zone melting makes lattice Parameter c decrease. Generally, the samples which have higher To have rather smaller lattice parameter c values.

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劉春芳 唐輝.工藝條件對(duì)C軸擇優(yōu)取向YBCO厚膜點(diǎn)陣常數(shù)的影響[J].稀有金屬材料與工程,1994,(1):26~30.[Liu Chunfang, Tang Hui, Xu Jingren, Zhou Lian. Influence of Process Conditions on Lattice Parameter of High Textured YBa2Cu3O7 Thick Films[J]. Rare Metal Materials and Engineering,1994,(1):26~30.]
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